ATIS T1.TR.48-1996

Test Patterns for DS0 and Synchronous Digital Data Circuits

The Alliance for Telecommunications Industry Solutions , 06/01/1996

Publisher: ATIS

File Format: PDF

$30.00$60.00

Standard By:The Alliance for Telecommunications Industry Solutions , 06/01/1996

Published:06/01/1996

File Size:1 file , 34 KB

Language:English

Note:This product is restricted and cannot be purchased in the following countries Ukraine, Russia, Belarus

This report documents the various test patterns used to qualify and troubleshoot both DS0 and Synchronous Digital Data Circuits.

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