BS 05/30135664 DC

IEC 60749-37. Semiconductor devices. Mechanical and climatic test methods. Part 37. Board level drop test method of components for handheld electronic products

BSI Group , 06/30/2005

Publisher: BS

File Format: PDF

$93.00$187.13

Description

Standard By:BSI Group , 06/30/2005

Published:06/30/2005

Pages:20

Cross References:IEC 60749-10IEC 60749-20IEC 60749-20-1

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