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  • BS 08/30138809 DC

BS 08/30138809 DC

BS ISO 23812. Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth calibration for silicon using multiple delta-layer reference materials

BSI Group , 02/19/2008

Publisher: BS

File Format: PDF

$124.00$249.06


Standard By:BSI Group , 02/19/2008
Published:02/19/2008
Pages:24
Cross References:ISO 18115:2001ISO 20341:2003

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