BS 08/30172398 DC

BS EN 62047-8. Semiconductor devices. Micro- electromechanical devices. Part 8. Strip bending test method for tensile property measurement of thin films

BSI Group , 02/18/2008

Publisher: BS

File Format: PDF

$135.00$270.03

Standard By:BSI Group , 02/18/2008

Published:02/18/2008

Pages:16

Cross References:IEC 62047-1:2005IEC 62047-2:2006IEC 62047-3:2006ISO 6892:1998ISO 15490:2000

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