BS 09/30190356 DC

BS EN 60749-40. Semiconductor devices. Mechanical and climatic test methods. Part 40. Board level drop test method using a strain gauge

BSI Group , 03/24/2009

Publisher: BS

File Format: PDF

$124.00$249.20

Standard By:BSI Group , 03/24/2009

Published:03/24/2009

Pages:24

Cross References:IEC 60749-10IEC 60749-20IEC 60749-20-1 IEC 60749-37

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$132.00 $264.16