BS PD IEC/TS 62607-6-4:2016

BS PD IEC/TS 62607-6-4:2016 establishes a method for determining the surface conductance of twodimensional(2D) single-layer or multi-layer atomically thin nano-carbon graphene structures.These are synthesized by chemical vapour deposition (CVD), epitaxial growth on siliconcarbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated fromgraphite [3]. The measurements are made in an air filled standard R100 rectangularwaveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].Surface conductance measurement by resonant cavity involves monitoring the resonantfrequency shift and change in the quality factor before and after insertion of the specimen intothe cavity in a quantitative correlation with the specimen surface area. This measurementdoes not explicitly depend on the thickness of the nano-carbon layer. The thickness of thespecimen does not need to be known, but it is assumed that the lateral dimension is uniformover the specimen area.Cross References:IEC 60153-2