IEC 60333 Ed. 3.0 b:1993

Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures

International Electrotechnical Commission , 07/14/1993

Publisher: IEC

File Format: PDF

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Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.

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