IEC 60512-25-3 Ed. 1.0 b:2001

Connectors for electronic equipment - Tests and measurements - Part 25-3: Test 25c - Rise time degradation

International Electrotechnical Commission , 07/26/2001

Publisher: IEC

File Format: PDF

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Standard By:International Electrotechnical Commission , 07/26/2001

Published:07/26/2001

Pages:23

File Size:1 file , 380 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes a method for measuring the effect a specimen has on the rise time of a signal passing through it.

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