IEC 60749-2 Ed. 1.0 b COR. 1:2003

Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure

International Electrotechnical Commission , 08/12/2003

Publisher: IEC

File Format: PDF

$121.00$242.13

Standard By:International Electrotechnical Commission , 08/12/2003

Published:08/12/2003

Pages:1

File Size:1 file , 59 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

$74.00 $148.00

$79.00 $159.00

$47.00 $95.00

$12.00 $25.00