IEC 60749-43 Ed. 1.0 b:2017

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

International Electrotechnical Commission , 06/15/2017

Publisher: IEC

File Format: PDF

$129.00$259.00

Description

Standard By:International Electrotechnical Commission , 06/15/2017

Published:06/15/2017

Pages:74

File Size:1 file , 1.1 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

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