IEC 60749-8 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

International Electrotechnical Commission , 08/30/2002

Publisher: IEC

File Format: PDF

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Standard By:International Electrotechnical Commission , 08/30/2002

Published:08/30/2002

Pages:31

File Size:1 file , 560 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

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