• IEC 62047-17 Ed. 1.0 b:2015

IEC 62047-17 Ed. 1.0 b:2015

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

International Electrotechnical Commission , 03/05/2015

Publisher: IEC

File Format: PDF

$117.00$234.00


IEC 62047-17:2015 specifies the method for performing bulge tests on the free-standing film that is bulged within a window. The specimen is fabricated with micro/nano structural film materials, including metal, ceramic and polymer films, for MEMS, micromachines and others. The thickness of the film is in the range of 0,1 μ to 10 μ, and the width of the rectangular and square membrane window and the diameter of the circular membrane range from 0,5 mm to 4 mm. The tests are carried out at ambient temperature, by applying a uniformly-distributed pressure to the testing film specimen with bulging window. Elastic modulus and residual stress for the film materials can be determined with this method.

More IEC Standards PDF

IEEE C37.233-2009

IEEE C37.233-2009

$62.00 $124.00

IEC 60502-1 Ed. 2.1 b:2009

IEC 60502-1 Ed. 2.1 b:2009

$221.00 $443.00

IEC 60630 Amd.6 Ed. 2.0 b:2009
IEC 60436 Ed. 3.1 en:2009

IEC 60436 Ed. 3.1 en:2009

$212.00 $424.00