• Your shopping cart is empty!

PDF Preview

IEC 62047-34 Ed. 1.0 en:2019

Semiconductor devices - Micro-electromechanical devices - Part 34: Test methods for MEMS piezoresistive pressure-sensitive device on wafer

International Electrotechnical Commission , 04/05/2019

Publisher: IEC

File Format: PDF

$47.00$95.00


Standard By:International Electrotechnical Commission , 04/05/2019
Published:04/05/2019
Pages:16
File Size:1 file , 1.2 MB
Language:English
Note:This product is unavailable in Ukraine, Russia, Belarus
IEC 62047-34:2019 (E) describes test conditions and test methods of electric character, static performances and thermal performances for MEMS pressure-sensitive devices. This document applies to test for both open and closed loop piezoresistive MEMS pressure devices on wafer.

More IEC Standards PDF

IEC 61557-7 Ed. 3.0 b:2019

IEC 61557-7 Ed. 3.0 b:2019

$47.00 $95.00

IEC 61158-1 Ed. 2.0 en:2019

IEC 61158-1 Ed. 2.0 en:2019

$208.00 $417.00

IEC 61400-3-1 Ed. 1.0 en:2019

IEC 61400-3-1 Ed. 1.0 en:2019

$240.00 $481.00

IEC 63093-12 Ed. 1.0 b:2019

IEC 63093-12 Ed. 1.0 b:2019

$72.00 $145.00