IEC 62374 Ed. 1.0 b:2007

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

International Electrotechnical Commission , 03/29/2007

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Standard By:International Electrotechnical Commission , 03/29/2007

Published:03/29/2007

Pages:43

File Size:1 file , 720 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

More IEC Standards PDF

ICC NJ-BC-2006

$60.00 $120.00

IEC 62391-2-1 Ed. 1.0 en:2006

$25.00 $51.00

IEEE C63.5-1998

$55.00 $110.00

ICC VA-REHAB-2006

$93.00 $186.02