IEC 62416 Ed. 1.0 b:2010

Semiconductor devices - Hot carrier test on MOS transistors

International Electrotechnical Commission , 04/26/2010

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Standard By:International Electrotechnical Commission , 04/26/2010

Published:04/26/2010

Pages:20

File Size:1 file , 890 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

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