IEC 62429 Ed. 1.0 b:2007

Reliability growth - Stress testing for early failures in unique complex systems

International Electrotechnical Commission , 11/30/2007

Publisher: IEC

File Format: PDF

$139.00$278.00

Description

Standard By:International Electrotechnical Commission , 11/30/2007

Published:11/30/2007

Pages:71

File Size:1 file , 1.2 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests.

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