IEC 62951-6 Ed. 1.0 b:2019

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 6: Test method for sheet resistance of flexible conducting films

International Electrotechnical Commission , 05/06/2019

Publisher: IEC

File Format: PDF

$95.00$190.00

Description

Standard By:International Electrotechnical Commission , 05/06/2019

Published:05/06/2019

Pages:50

File Size:1 file , 1.9 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 62951-6:2019 specifies terms, as well as the test method and report of sheet resistance of the flexible conducting film under bending and folding tests. The measurement methods include the 2-point probe, 4-point probe and Montgomery method, which can be applied to in-situ and ex-situ measurement and the measurements of anisotropic sheet resistance.

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