IEC 63011-3 Ed. 1.0 b:2018

Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via

International Electrotechnical Commission , 11/28/2018

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 11/28/2018

Published:11/28/2018

Pages:28

File Size:1 file , 2.5 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 63011-3:2018 specifies a reference model of through-silicon via (TSV) electrical characteristics required for an interface design in three dimensional integrated circuit (3-D IC) to transmit and receive digital data and measurement conditions for resistance and capacitance to specify TSV characteristics in 3-D IC.
Power devices, RF devices and micro-electromechanical systems (MEMS) are not in the scope of this document.

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