IEC 63202-1 Ed. 1.0 b:2019

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

International Electrotechnical Commission , 06/20/2019

Publisher: IEC

File Format: PDF

$25.00$51.00

Description

Standard By:International Electrotechnical Commission , 06/20/2019

Published:06/20/2019

Pages:17

File Size:1 file , 1.1 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.

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