JIS C 2162:2010

Name: JIS C 2162:2010|2010 edition pdf
Price: 27 USD
Availability: InStock

Test method of long-term reliability of gate insulator for SiC devices at high temperature

Japanese Industrial Standard / Japanese Standards Association , 01/01/2010

Publisher: JIS

File Format: PDF

$27.00$54.00

Standard By:Japanese Industrial Standard / Japanese Standards Association , 01/01/2010

Published:01/01/2010

Language:English

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