JIS Z 4334:2005

Reference sources for the calibration of surface contamination monitors -- Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)

Japanese Industrial Standard / Japanese Standards Association , 01/01/2005

Publisher: JIS

File Format: PDF

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Standard By:Japanese Industrial Standard / Japanese Standards Association , 01/01/2005

Published:01/01/2005

Language:English

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