BS CECC 00013:1985

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

BSI Group , 08/30/1985

Publisher: BS

File Format: PDF

$132.00$264.16

Standard By:BSI Group , 08/30/1985

Published:08/30/1985

Pages:24

ISBN(s):0580146022

File Size:1 file , 820 KB

Language:English

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

$25.00 $50.00

$28.00 $57.00

$22.00 $44.00

$24.00 $49.00