BS CECC 00013:1985

Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice

BSI Group , 08/30/1985

Publisher: BS

File Format: PDF

$132.00$264.16

Standard By:BSI Group , 08/30/1985

Published:08/30/1985

Pages:24

ISBN(s):0580146022

File Size:1 file , 820 KB

Language:English

Note:This product is unavailable in Ukraine, Russia, Belarus

Describes equipment and procedures to be used for SEM inspection of discrete semiconductor devices and integrated circuits.

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$132.00 $264.16

$132.00 $264.16

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