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IEC 60749-13 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

International Electrotechnical Commission , 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00


Standard By:International Electrotechnical Commission , 04/12/2002
Published:04/12/2002
Pages:9
File Size:1 file , 400 KB
Language:English, French
Note:This product is unavailable in Ukraine, Russia, Belarus
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive.

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