IEC 60749-17 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

International Electrotechnical Commission , 02/20/2003

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 02/20/2003

Published:02/20/2003

Pages:11

File Size:1 file , 410 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.

IEC 60749-17 Ed. 1.0 b:2003 History

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