IEC 60749-26 Ed. 2.0 b:2006

Semiconductor devices - Mechanical and climatic test methods - Part 26: Electrostatic discharge (ESD) sensitivity testing - Human body model (HBM)

International Electrotechnical Commission , 07/18/2006

Publisher: IEC

File Format: PDF

$39.00$79.00

Description

Standard By:International Electrotechnical Commission , 07/18/2006

Published:07/18/2006

Pages:27

File Size:1 file , 520 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model (HBM) electrostatic discharge (ESD). The objective is to provide reliable, repeatable HBM ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive.