IEC 60749-29 Ed. 1.0 b:2003

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

International Electrotechnical Commission , 11/04/2003

Publisher: IEC

File Format: PDF

$55.00$110.00

Description

Standard By:International Electrotechnical Commission , 11/04/2003

Published:11/04/2003

Pages:41

File Size:1 file , 920 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""No Trouble Found"" and ""Electrical Overstress"" failures due to latch-up.