IEC 60749-30 Ed. 2.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

International Electrotechnical Commission , 08/17/2020

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 08/17/2020

Published:08/17/2020

Pages:26

File Size:1 file , 1.1 MB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

IEC 60749-30:2020 establishes a standard procedure for determining the preconditioning of non-hermetic surface mount devices (SMDs) prior to reliability testing. The test method defines the preconditioning flow for non-hermetic solid-state SMDs representative of a typical industry multiple solder reflow operation.