IEC 60749-32 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)

International Electrotechnical Commission , 08/30/2002

Publisher: IEC

File Format: PDF

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Description

Standard By:International Electrotechnical Commission , 08/30/2002

Published:08/30/2002

Pages:9

File Size:1 file , 350 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to external heating. The test uses a needle flame, simulating the effect of small flames which may result from fault conditions within equipment containing the device.