IEC 60749-4 Ed. 1.0 b:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

International Electrotechnical Commission , 04/12/2002

Publisher: IEC

File Format: PDF

$11.00$23.00

Description

Standard By:International Electrotechnical Commission , 04/12/2002

Published:04/12/2002

Pages:15

File Size:1 file , 510 KB

Language:English, French

Note:This product is unavailable in Ukraine, Russia, Belarus

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

IEC 60749-4 Ed. 1.0 b:2002 History

IEC 60749-4 Ed. 2.0 b:2017

$25.00 $51.00

IEC 60749-4 Ed. 2.0 en:2017

$25.00 $51.00

IEC 60749-4 Ed. 1.0 b CORR1:2003

$117.00 $234.90

IEC 60749-4 Ed. 1.0 b:2002

$11.00 $23.00

More IEC Standards PDF

IEC 60601-2-54 Ed. 1.2 b:2018

$348.00 $696.00

IEC /IEEE 60255-118-1 Ed. 1.0 en:2018

$196.00 $392.00

IEC 60050-511 Ed. 1.0 b:2018

$25.00 $51.00

IEC 60050-871 Ed. 1.0 b:2018

$164.00 $329.00