IEC 61189-5-503 Ed. 1.0 b:2017

Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards

International Electrotechnical Commission , 05/22/2017

Publisher: IEC

File Format: PDF

$95.00$190.00


IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).

IEC 61189-5-503 Ed. 1.0 b:2017 History

IEC 61189-5-503 Ed. 1.0 b:2017
IEC 61189-5-503 Ed. 1.0 en:2017

More IEC Standards PDF

IEC 62386-217 Ed. 1.0 b:2018
IEEE 802.11aj-2018

IEEE 802.11aj-2018

$147.00 $295.00

IEC 60794-1-31 Ed. 1.0 b:2018
IEC 62005-9-4 Ed. 1.0 b:2018