IEC 62884-2 Ed. 1.0 b:2017

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

International Electrotechnical Commission , 08/30/2017

Publisher: IEC

File Format: PDF

$95.00$190.00


IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE - Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

IEC 62884-2 Ed. 1.0 b:2017 History

IEC 62884-2 Ed. 1.0 en:2017
IEC 62884-2 Ed. 1.0 b:2017

More IEC Standards PDF

IEC 60601-2-35 Ed. 2.0 b:2020
IEC /SRD 63199 Ed. 1.0 en:2020
IEC 60335-2-82 Ed. 3.1 b:2020
IEEE 2140.5-2020

IEEE 2140.5-2020

$29.00 $59.00