• IEEE 1139-2022

IEEE 1139-2022

IEEE Standard Definitions of Physical Quantities for Fundamental Frequency and Time Metrology--Random Instabilities

IEEE , 12/08/2022

Publisher: IEEE

File Format: PDF

$40.00$81.00


IEEE 1139-2022 PDF

This standard covers the fundamental metrology for describing random instabilities of importance to frequency and time metrology. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency and phase fluctuations. In addition, recommendations are made for the reporting of measurements of frequency, amplitude, and phase instabilities, especially with regard to calculation techniques, but also including experimental parameters. The annexes cover basic concepts and definitions, time prediction, and confidence limits when estimating deviations and spectral densities from a finite data set. The annexes also cover translation between the frequency domain and time domain instability measures, examples on how to calculate the time-domain measures of frequency and phase fluctuations, and an extensive bibliography of the relevant literature. Systematic instabilities, such as environmental effects and aging, are discussed in IEEE Std 1193 [B39] This standard defines and formalizes the techniques and physical quantities used to measure and characterize frequency, phase, and amplitude instabilities in time and frequency instruments and systems. Revision Standard - Active. Methods of describing random instabilities of importance to frequency and time metrology are covered in this standard. Quantities covered include frequency, amplitude, and phase instabilities; spectral densities of frequency, amplitude, and phase fluctuations; and time-domain deviations of frequency fluctuations. In addition, recommendations are made for the reporting of measurements of frequency, amplitude, and phase instabilities, especially with regard to the recording of experimental parameters, experimental conditions, and calculation techniques.

IEEE 1139-2022 History

IEEE 1139-2022

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