IEEE 1445-2016

IEEE Standard for Digital Test Interchange Format (DTIF)

IEEE , 01/27/2017

Publisher: IEEE

File Format: PDF

$41.00$82.00


IEEE 1445-2016 PDF

This standard defines DATPG output data formats and informational content for UUT models, stimulus and response patterns, fault dictionaries, and diagnostic probing. These outputs provide a standard exchange format to automatic test equipment (ATE). This standard is to be used as the standard definition of DATPG output formats and informational content. Revision Standard - Active. The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for board-level printed circuit assemblies are defined. This information can be broadly grouped into data that defines the following: user under test (UUT) model, stimulus and response, fault dictionary, and probe.

IEEE 1445-2016 History

IEEE 1445-2016

IEEE 1445-2016

$41.00 $82.00

IEEE 1445-1998

IEEE 1445-1998

$65.00 $130.00

More IEEE Standards PDF

IEC 62988 Ed. 1.0 b:2018

IEC 62988 Ed. 1.0 b:2018

$72.00 $145.00

IEEE 3006.8-2018

IEEE 3006.8-2018

$52.00 $104.00

IEC 61000-6-4 Ed. 3.0 b:2018
IEC 61125 Ed. 2.0 b:2018

IEC 61125 Ed. 2.0 b:2018

$117.00 $234.00