IEEE 592-2007

IEEE Standard for Exposed Semiconducting Shields on High-Voltage Cable Joints and Separable Connectors

IEEE , 05/08/2008

Publisher: IEEE

File Format: PDF

$53.00$106.00

Description

Standard By:IEEE , 05/08/2008

Published:05/08/2008

Pages:10

ISBN(s):9780738153490, 9780738153483, 9780738169743

File Size:1 file , 1 MB

Language:English

Note:This product is unavailable in Russia, Belarus

This standard covers design tests for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV. Revision Standard - Superseded. Revision of IEEE Std 592-1990. Design test for shield resistance and a simulated fault-current initiation for exposed semiconducting shields used on cable accessories, specifically joints and separable insulated connectors rated 15 kV through 35 kV is provided in this standard.