SAE J2052_201607

Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

SAE International , 07/12/2016

Publisher: SAE

File Format: PDF

$37.00$74.00

Description

Standard By:SAE International , 07/12/2016

Published:07/12/2016

File Size:1 file , 170 KB

Language:English

Note:This product is unavailable in Ukraine, Russia, Belarus

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

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