IEC 60191-6-3 Ed. 1.0 en:2000

Mechanical standardization of semiconductor devices - Part 6-3: General rules for the preparation of outline drawings of surface mounted semiconductor device packages - Measuring methods for package dimensions of quad flat packs (QFP)

International Electrotechnical Commission , 09/29/2000

Publisher: IEC

File Format: PDF

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Stipulates a method for quad flat packs measuring dimensions which are classified into Form E.

IEC 60191-6-3 Ed. 1.0 en:2000 History

IEC 60191-6-3 Ed. 1.0 en:2000
IEC 60191-6-3 Ed. 1.0 b:2000

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